Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface.
نویسندگان
چکیده
By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL23L23 Auger transition in MgO ultrathin films (4-6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.
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ورودعنوان ژورنال:
- Physical review letters
دوره 111 2 شماره
صفحات -
تاریخ انتشار 2013